[1]
H. M. Rietveld, Acta Crystallogr. Vol. 2 (1967), p.151.
Google Scholar
[2]
H.M. Rietveld, J. Appl. Crystallogr. Vol. 2 (1969), p.65.
Google Scholar
[3]
A. K. Cheetham, Ab initio structure solution with powder diffraction data" in "The Rietveld Method, ed. R.A. Young, Oxford University Press, 1993, p.276.
Google Scholar
[4]
F. Weitzer, L. Perring, T. Shibayanagi, M. Naka, J.C. Shuster, Powder Diffr. Vol. 15 (2000)p.91.
Google Scholar
[5]
S.N. Achary, A. K. Tyagi, S.K. Kulshreshtha, O. D. Jayakumar, P. S. R. Krishna, A.B. Shinde, K. R. Chakraborty, Powder Diffr. Vol. 20 (2005) p.207.
Google Scholar
[6]
R. Delhez, T.H. de Keijser, J.I. Langford, D. Louër, E. J. Mittemeijer, E.J. Sonneveld, Crystal imperfection broadening and peak shape in the Rietveld method" in "The Rietveld Method, ed. R.A. Young, Oxford University Press, 1993, p.132.
Google Scholar
[7]
R. J. Hill, C. J. Howard, J. Appl. Crystallogr. Vol. 20 (1987), p.467.
Google Scholar
[8]
D. L. Bish, S.A. Howard, J. Appl. Crystallogr. Vol. 21 (1988), p.86.
Google Scholar
[9]
European Standard EN13925 "Non destructive Testing - X-ray diffraction from polycrystalline and amorphous material.
Google Scholar
[10]
G. J. McCarthy, D. M. Johansen, Powder Diffr. Vol. 3 (1988), p.156.
Google Scholar
[11]
R.S. Winburn, D.G. Grier, G.J. McCarthy, R.B. Peterson, Powder Diffr. Vol. 15(2000) p.163.
Google Scholar
[12]
C.R. Ward, D. French, http: /www. flyash. info/2005/209war. pdf.
Google Scholar
[13]
SIROQUANTTM Quantitative XRD Software, User's Guide and Reference, Ver. 2. 5 for Windows, (2000).
Google Scholar
[14]
F.H. Chung, J. Appl. Cryst. Vol. 7 (1974) p.519, 526.
Google Scholar
[15]
G.J. McCarthy, Energy: By-Products of Coal Combustion in Power Plants" in "Industrial Applications of X-Ray Diffraction, eds. F.H. Chung, D.K. Smith, Marcel Dekker, Inc. 2000, p.555.
Google Scholar
[16]
J.S. Fruchter, D. Rai, J. M. Zacharavol. 24 (1990) p.1173.
Google Scholar