Paper Titles
SAXS Study of Selected Cationic Surfactant Influence on the DSPC-Based Model Phospholipid System
p.257
Temperature-Controlled Devitrification of Oxyfluoride Borate Glasses
p.263
X-Ray Diffraction Investigations of Crystallic Structure Changes in the Ni-Based Alloy at the Thermal Cycling
p.267
Structural Changes in New Rapidly-Quenched Finemet Type and Hitperm Type Alloys
p.273
Quantitative Phase Analysis of Fly Ashes from Six Polish Power Stations
p.277
Lattice and Peak Profile Parameters in GIXD Technique
p.281
The Structure Studies on Si-N Thin Layers
p.287
The Reflectometry Studies on SiC and SiN Thin Layers
p.293
Studies on Al2O3 - ZrO2 Coatings Structure before and after Thermal Treatment
p.297

Lattice and Peak Profile Parameters in GIXD Technique

Article Preview

Abstract:

Grazing incident X-ray diffraction technique was applied to determine the influence of incident beam angle (α angle) on structural parameters as well as peak profile. X-ray diffraction patterns were registered in asymmetrical geometry, in which a parallel beam was formed by Soller and divergence slits. Lowering of the α angle results in accuracy decrease of lattice parameters as well as in significant broadening of a half-width of X-ray diffraction line.

You might also be interested in these eBooks
APPLIED CRYSTALLOGRAPHY XX View Preview

Info:

Periodical:

Solid State Phenomena (Volume 130)

Pages:

281-286

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.130.281

Citation:

Cite this paper

Online since:

December 2007

Authors:

Tomasz Goryczka, Grzegorz Dercz, Lucjan Pająk, Eugeniusz Łągiewka

Keywords:

GIXD, LeBail Refinement, X-Ray Diffraction (XRD)

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2007 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

References

[1] W. Kautek, S. Mirwald, M. Sahre, G.E. Nauer, Electr. Acta. 43 (1998) p.2979.

Google Scholar

[2] A. Njeh, T. Wieder, M.H. B. Ghozlen, H. Fuess, Mat. Charcater. 52 (2004) p.135.

Google Scholar

[3] N.A. Raftery and R. Vogel, J. App. Cryst. 37 (2004) p.357.

Google Scholar

[4] Certificate of Standard Reference Material 660a, NIST, September (2000).

Google Scholar

[5] Certificate of Standard Reference Material Al2O3, NIST, November (1991).

Google Scholar

[6] B.A. Hunter, Rietica -A Visual Rietveld Program. Commission on Powder Diffraction Newsletter, 20 (1998) p.21.

Google Scholar

[7] A. LeBail, J. of Solid State Chem., 103 (1993) p.287.

Google Scholar

[8] H.M. Rietveld, J. of Appl. Cryst. 2 (1969) p.65.

Google Scholar