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Nanoscale Imaging of CaCu3Ti4O12 Dielectric Properties: The Role of Surface Defects

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Abstract:

Scanning probe microscopy with conductive tips has been used to image the dielectric properties of ceramics with giant permittivity. In particular, measurements in impedance mode and of local resistivity allowed to image the permittivity map on polycrystalline materials. Such imaging allows to correlate the dielectric properties with the local sample structure and with defects inside the single grains of the polycrystalline ceramics. However, artifacts due to surface imperfections should be distinguished from bulk properties and eliminated.

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Periodical:

Solid State Phenomena (Volumes 131-133)

Pages:

443-448

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.131-133.443

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Cite this paper

Online since:

October 2007

Authors:

Vito Raineri, Patrick Fiorenza, Raffaella Lo Nigro, Derek C. Sinclair

Keywords:

CaCu3Ti4O12 Ceramics, Conductive Atomic Force Microscopy, Dielectric Property, Electric Domains, Grain Boundary, Scanning Impedance Microscopy (SIM), Scanning Probe Microscope

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© 2008 Trans Tech Publications Ltd. All Rights Reserved

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References

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