Clustering of Gold on 6H-SiC and Local Nanoscale Electrical Properties

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Abstract:

In this work, a methodology, based on a self-organization process, to form gold nanoclusters on the 6H-SiC surface, is illustrated. By scanning electron microscopy and atomic force microscopy the gold self-organization induced by annealing processes was studied and modelled by classical limited surface diffusion ripening theories. These studies allowed us to fabricate Au nanoclusres/SiC nanostructured materials with tunable structural properties. The local electrical properties of such a nanostructured material were probed, by conductive atomic force microscopy collecting high statistics of I-V curves. The main observed result was the Schottky barrier height (SBH) dependence on the cluster size. This behaviour is interpreted considering the physics of few electron quantum dots merged with the ballistic transport. A quite satisfying agreement between the theoretical forecast behaviour and the experimental data has been found.

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Solid State Phenomena (Volumes 131-133)

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517-522

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October 2007

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© 2008 Trans Tech Publications Ltd. All Rights Reserved

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[1] P. Moriarty, Rep. Prog. Phys. 64, 297, (2001).

Google Scholar

[2] Nanoparticles, edited by G. Schmid, Wiley-VCH, (2004).

Google Scholar

[3] Beszeda, E. G. Gontier-Moya, Á. W. Imre, Appl. Phys. A, 81, 673, (2005).

Google Scholar

[4] A. Baldan, Journal of Material Science 37, 2171, (2002).

Google Scholar

[5] I. M. Lifshitz, V. V. Slyozov, J. Phys. Chem. Solids 19, 35, (1961).

Google Scholar

[6] C. Wagner, Z. Electrochem. 65, 581, (1961).

Google Scholar

[7] M. Zinke-Allmang, L. C. Feldman, M. H. Grabov, Surf. Sci. Rep. 16, 377, (1992).

Google Scholar

[8] Beszeda, E. G. Gontier-Moya, Á. W. Imre, Appl. Phys. A, 81, 673, (2005).

Google Scholar

[9] P. Buffat, J. P. Borel, Phys. Rev. A 13, 2287, (1976).

Google Scholar

[10] K. N. Tu, J. W. Mayer, L. C. Feldman, Electronic Thin Film Science, Macmilian Publishing Company, (1992).

Google Scholar

[11] F. Giannazzo, F. Roccaforte, V. Raineri, S. F. Liotta, Europhys. Lett. 74, 686, (2006).

Google Scholar

[12] F. Ruffino, F. Giannazzo, F. Roccaforte, V. Raineri, M. G. Grimaldi, Appl. Phys. Lett. 89, 243113, (2006).

DOI: 10.1063/1.2405407

Google Scholar

[13] L. P. Kouwenhoven, D. G. Austing, S. Tarucha, Rep. Prog. Phys. 64, 701, (2001).

Google Scholar

[14] A. Zangwill, `Physics at Surfaces', Cambridge Univ. Press, Cambridge, 1988. Fig. 4 Schottky barrier height distributions. (a) Reference sample (sample without Au cluster); sample with Au cluster mean diameter of (b) nm)03. 046. 1( � ; (c) nm)12. 078. 2( � ; (d) nm)12. 082. 6( � . Fig. 5 Experimental values (dots) of the SBH as a function of mean cluster size and theoretical prediction for eVB 85. 1�� , 08. 0 * �m and 08. 0 * �m . The inset show the considered band diagram of the system (AFM) tip-cluster-SiC substrate.

Google Scholar