Grain Growth in Polycrystalline Materials II
Materials Science Forum Volumes 204 - 206
doi:10.4028/www.scientific.net/MSF.204-206
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p193
Chemically Induced Interface Migration
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832 K
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Authors: Duk Yong Yoon -
p207
Grain Boundary Structure and Growth Sequence of Diamond Thin Film
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453 K
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Authors: Yu Long Zhang, H. Ichinose, Kenji Ito, Yuuki Ishida, M. Nakanose -
p215
Phase Boundary Migration Due to Interdiffusion
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291 K
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Authors: M. Onishi, F. Furukawa, Toshitada Shimozaki -
p221
Grain Boundary Migration in Fe-3%Si Bicrystal
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511 K
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Authors: Sadahiro Tsurekawa, T. Ueda, Kiyoshi Ichikawa, H. Nakashima, Y. Yoshitomi, H. Yoshinaga -
p227
Computer Simulation of Grain Boundary in BCC Fe by Embedded Atom Method
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342 K
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Authors: Ryuzo Watanabe, Atsushi Nogami, T. Matsumiya -
p233
Monte Carlo Simulation of Interactions between Grain Boundary Migration and Precipitation
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405 K
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Authors: Y. Tsuzuki, Y. Suzuki -
p239
Correlation of Grain Boundary Energy with Boundary Dislocation Density
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434 K
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Authors: Koichiro Morita, Sadahiro Tsurekawa, H. Nakashima, H. Yoshinaga -
p245
Molecular Dynamics Simulations of the Melting of a Twist Σ=5 Grain Boundary
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120 K
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Authors: J. Lu, Jerzy A. Szpunar -
p247
Some Theoretical Considerations on Abnormal Grain Growth
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463 K
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Authors: Paulo Rangel Rios -
p257
Physical Aspects of Grain Growth Phenomena
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566 K
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Authors: Yasuhiro Yamazaki, Tadao Watanabe -
p267
Three-Dimensional Computer Modeling of Grain Growth: A Vertex model Approach
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703 K
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Authors: K. Fuchizaki, Kenji Kawasaki -
p279
Quantitative Analysis of DIGM in Binary Sytems Using a Model of Driving Energy for Alloying
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545 K
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Authors: M. Kajihara, T. Mori -
p289
Simulation of Normal Grain Growth by the 3-D Statistical Model
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252 K
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Authors: R. Brandt, W. Graupner, K. Lücke -
p295
Normal and Abnormal Grain Growth and Particularly the Behaviour of Large and Small Grains as Predicted by Simulations on the Basis of the Statistical Model
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349 K
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Authors: R. Brandt, W. Graupner, K. Lücke -
p303
A Study on Three Dimensional Monte Carlo Method for Grain Growth Simulation
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315 K
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Authors: Atsushi Nogami, T. Matsumiya, Yusuke Fukuda
