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Electron Microscopy XIV

Volume 186
doi: 10.4028/www.scientific.net/SSP.186
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Paper Title Page

Preface and Conference Photo

Methods of Electron Crystallography as Tools for Materials Analysis

Authors: Wolfgang Neumann, Holm Kirmse, Ines Häusler, Corinna Grosse, Peter Moeck, Sergei Rouvimov, Matt Beekman, Ryan Atkins, David C. Johnson, Kerstin Volz

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Characterization of Grain Boundary Geometry in the TEM, Exemplified in Si Thin Films

Authors: János L. Lábár, Ákos K. Kiss, Silke Christiansen, Fritz Falk

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Orientation and Phase Mapping in TEM Microscopy (EBSD-TEM Like): Applications to Materials Science

Authors: Edgar F. Rauch, Muriel Véron, Stavros Nicolopoulos, Daniel Bultreys

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The Art and Application of Large Angle Convergent Beam Electron Diffraction

Authors: Elżbieta Jezierska

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Cathodoluminescence and Electroluminescence of Semiconductor Structures in SEM

Authors: Mariusz Płuska, Andrzej Czerwiński, Jacek Ratajczak, Anna Szerling, Jerzy Kątcki

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Secondary Electron Detector with the Unipotential Lens Structure for Variable Pressure/Environmental SEM

Authors: Witold Słówko, Michał Krysztof

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A Quantitative Analytical Method for the Identification and Characterization of Mineralized Nanoparticles in Food Supplements

Authors: Susanne Richter, Klaus Riediger, Angelika Nester

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Physical and Chemical Studies of Bacterial Bioaerosols at Wastewater Treatment Plant Using Scanning Electron Mikroscopy and X-Ray Photoelectron Spectroscopy

Authors: Justyna Płoszaj, Ewa Talik, Zofia Piotrowska-Seget, Józef S. Pastuszka

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3D Imaging and Metrology of Yttria Dispersoids in INCOLOY MA956 by Electron Tomography

Authors: Adam Kruk, Beata Dubiel, Aleksandra Czyrska-Filemonowicz

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