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Papers by Author: A. Poyai

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p-n Junction Leakage in Neutron-Irradiated Diodes Fabricated in Various Silicon Substrates

Authors: A. Czerwinski, Eddy Simoen, A. Poyai, Cor Claeys, H. Ohyama

447

Assessment of Radiation Induced Lattice Defects in Shallow Trench Isolation Diodes Irradiated by Neutron

Authors: K. Kobayashi, H. Ohyama, K. Hayama, Y. Takami, Eddy Simoen, A. Poyai, Cor Claeys, A. Mohammadzadeh, S. Kohiki

357

P-N- Junction Peripheral Current Analysis using Gated Diode Measurements

Authors: A. Czerwinski, Eddy Simoen, A. Poyai, Cor Claeys

437

Improved Microwave Absorption Technique for Bulk and Surface Lifetime Analysis in Processed Si Wafers

Authors: Eugenijus Gaubas, Eddy Simoen, Cor Claeys, A. Poyai

155