Papers by Author: Andrea Preusser

Abstract: The new developed “sweeping detector” techniques using high energy synchrotron radiation allow to measure textures and microstructures of materials and their change during heat treatment with high location and orientation resolution. Here we show these new methods applied to cold rolled and subsequently annealed nickel samples. The grain-resolved measurements show, impressively, many details of the recrystallization process which can otherwise not be seen. The results of these measurements can be the base for omprehensive recrystallization theories.

Abstract: Additional to the position of any volume element of a (poly)-crystalline material its crystal orientation must also be known. Both together are described in the six-dimensional orientation-location space. The paper describes the most frequent structures of materials in this space and how these can be imaged with the "Moving Area Detector Method" using hard synchrotron X-rays. This technique is equally well suited for basic reseach in materials science as well as for non-destructive testing of technological parts or even complex structural components.

Abstract: The newly developed “sweeping detector” technique with high energy synchrotron radiation allows to measure textures and microstructures of materials with high location and orientation resolution. This method was applied to hot rolled aluminium manganese alloys and to rolled nickel samples in different recrystallization stages. The grain-resolved measurements show, impressively, many details of the recrystallization process which can otherwise not be seen. That can be the base for comprehensive recrystallization theories.