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Articles by author: Atsushi Ikari

• Defect Control in Nitrogen Doped Czochralski Silicon Crystals
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p161)
• Formation of Oxygen Clusters in Quenched Cz- and MCz-Si Crystals
  Published in: Shallow Impurities in Semiconductors V (p225)
• Investigation of Crystal Defects in Epitaxial Layers on Nitrogen-Doped Substrates and a Method for their Suppression
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p11)
• Oxygen Clusters in As-Grown Cz-Si Crystals Probed by Positron Annihilation
  Published in: Defects in Semiconductors 17 (p1583)
• Oxygen Microclusters in Quenched Si Studied by Positron Annihilation
  Published in: Positron Annihilation - ICPA-9 (p1301)
• Vacancy-Oxygen Complexes in Si Probed by Positron Annihilation
  Published in: Positron Annihilation - ICPA-10 (p553)