Papers by Author: C.D. Beling

Paper TitlePage

Design and Implementation of a S-Parameter Wafer Defect Scanner
Authors: P.S. Naik, C.D. Beling, S. Fung
501
Optimized Coincidence Doppler Broadening Spectroscopy Using Deconvolution Algorithms
Authors: K.F. Ho, H.M. Ching, K.W. Cheng, C.D. Beling, S. Fung, K.P. Ng
477
Millimeter Positron Focusing Using a Hybrid Lens Design
Authors: C.K. Cheung, P.Y. Kwan, Y.Y. Shan, P.S. Naik, H.M. Weng, C.D. Beling, S. Fung
465
Identities of the Deep Level Defects E1/E2 in 6H Silicon Carbide
Authors: C.C. Ling, X.D. Chen, M. Gong, H.M. Weng, D.S. Hang, C.D. Beling, S. Fung, T.W. Lam, C.H. Lam
135
Positron-Electron Autocorrelation Function Study of E-Center in Phosphorus-Doped Silicon
Authors: K.F. Ho, C.D. Beling, S. Fung, M. Biasini, Gabriel Ferro, M. Gong
111
Memorial of Alan Smith (1937 – 2001)
Authors: C.D. Beling
9
Changes in the Positron-Electron Momentum Distribution in GaAs Brought about by Chopped Light
Authors: Stella Li, S. Fung, C.D. Beling, C.C. Ling
114
Electrically Induced Metastability in SI-GaAs Studied by Positron Lifetime Spectroscopy
Authors: Y.L. Luo, C.D. Beling, S. Fung, C.C. Ling, M.K. Lui, W.K. Mui
108
A Monte-Carlo Study of Defect Sensitivity Limits in Positron Lifetime Spectroscopy
Authors: H.Y. Chin, C.C. Ling, S. Fung, C.D. Beling
692
Deconvoluting Double Doppler Spectra
Authors: K.F. Ho, K.P. Ng, C.D. Beling, S. Fung, K.L. Chan, H.W. Tang
673
Showing 1 to 10 of 29 Paper Titles