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CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by author: D.S. Poloskin
15 papers on 1 page:
1
Defect Production and Annealing in Degenerate Silicon Irradiated with fast Electrons at Low Temperatures
Published in:
Defects in Semiconductors 18
(p151)
Donor Centers in Er-Implanted Silicon
Published in:
Defects in Semiconductors 19
(p1515)
Electrically Active Centers in Silicon Doped with Erbium
Published in:
Defects in Semiconductors 18
(p615)
Electron Traps in Undoped GaN Layers Subjected to Gamma-Irradiation and Annealing
Published in:
Silicon Carbide and Related Materials 2000
(p799)
Fast Neutron Transmutation Reactions in Si - A New Way of Introduction of Mg-Related Centers
Published in:
Defects in Semiconductors 17
(p129)
Frenkel Pairs and Impurity-Defect Interactions in p-Type Silicon Irradiated with Fast Electrons and Gamma-Rays at Low Temperatures
Published in:
Defects in Semiconductors 19
(p575)
Impact of Compressive Stress on the Formation of Thermal Donors in Heat-Treated Silicon
Published in:
Gettering anf Defect Engineering in Semiconductor Technology IX
(p259)
Impact of Radiation-Induced Defects on the Yellow Luminescence Band in MOCVD GaN
Published in:
Defects in Semiconductors 19
(p1143)
Impurity Centers Associated with Magnesium Introduced in Silicon by Fast Neutron Transmutation Reactions
Published in:
Defects in Semiconductors 18
(p163)
Influence of Point Defects on Defect Formation in Si:Er
Published in:
Gettering and Defect Engineering in Semiconductor Technology VI
(p299)
Rare Earth Impurities and Impurity-Related Centers in Silicon
Published in:
Gettering and Defect Engineering in Semiconductor Technology VIII
(p365)
Silicon Impurity-Related Effects on Structural Defects in III-V Nitrides
Published in:
Gettering and Defect Engineering in Semiconductor Technology VIII
(p525)
Surface Gettering Background Impurities and Defects in GaAs Plates
Published in:
Gettering and Defect Engineering in Semiconductor Technology VIII
(p279)
Thermal Donors in Silicon Doped with Erbium
Published in:
Gettering and Defect Engineering in Semiconductor Technology VII
(p207)
Thermal Donors in Silicon Implanted with Rare Earth Impurities
Published in:
Gettering anf Defect Engineering in Semiconductor Technology IX
(p93)
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