Articles by author: Eicke R. Weber
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A Study of the Copper-Pair Related Centers in Silicon
Published in: Defects in Semiconductors 19 (p467) -
Anisotropy of the Elastic Properties of Wurtzite InN Epitaxial Films
Published in: Defects and Diffusion in Ceramics (p79) -
Characterization of EL2 in Annealed LT-GaAs
Published in: Defects in Semiconductors 17 (p1599) -
Copper in Silicon: Quantitative Analysis of Internal and Proximity Gettering
Published in: Defects in Semiconductors 19 (p461) -
Defect Control and Gettering in Cz-Silicon
Published in: Gettering and Defect Engineering in Semiconductor Technology (p137) -
Defect Control in As-Rich GaAs
Published in: Defects in Semiconductors 19 (p951) -
Electronic Structure of PIn Antisite in InP
Published in: Defects in Semiconductors 17 (p211) -
Gettering of Transition Metals in Multicrystalline Silicon
Published in: Defects in Semiconductors 18 (p1979) -
Gettering of Transition Metals in Multicrystalline Silicon for Photovoltaic Applications
Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p165) -
Gettering Strategies for SOI Wafers
Published in: Gettering and Defect Engineering in Semiconductor Technology X (p547) -
Influence of Growth Rate and Temperature on the Structure of Low Temperature GaAs
Published in: Defects in Semiconductors 16 (p1045) -
Influence of Oxygen Precipitates on the Solution of Transition Metals in Silicon
Published in: Defects in Semiconductors 14 (p881) -
Interaction of EL2 in Semiinsulating GaAs with above Bandgap Light
Published in: Defects in Semiconductors 16 (p881) -
Investigation of Microdefects in Multicrystalline Silicon for Photovoltaic Applications
Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p449) -
Local Measurements of Diffusion Length and Chemical Character of Metal Clusters in Multicrystalline Silicon
Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p577)