Papers by Author: H. Tomokage

Paper TitlePage

Controlling Process of P Diffusion in Si Based on the Pair Diffusion Model
Authors: Masayuki Yoshida, Masami Morooka, M. Takahashi, H. Tomokage
617
Field Emission Characteristics of Plasma Enhanced Chemical Vapor Deposited Diamond-Like Carbon Films Using Scanning Probe Measurements
Authors: W. Choi, E.R. Hwang, N. Nomura, S. Itose, Y. Iseri, T. Ando, Young Do Kim, H. Tomokage
191
Surface Characterization of Plasma Etched DLC Films by Scanning Tunneling Microscopy and Atomic Force Microscopy
Authors: E.R. Hwang, W. Choi, Y. Iseri, H. Tomokage
183
Scanning Probe Field Emission Current Measurements on Polycrystalline Diamond Films
Authors: H. Wakimoto, H. Tomokage, Young Do Kim, W. Choi, Y. Iseri, T. Ando
177
Defect Characterization in Metal-Oxide-Semiconductor Field-Effect-Transistors with Trench Gates by Electron Beam-Induced Current Technique
Authors: H. Tomokage, Y. Ishiwata, H. Souno, Masahiro Kawakami, N. Sonoda
407
Behaviour of Substitutional Gold in Silicon
Authors: Masayuki Yoshida, Masami Morooka, H. Tomokage
139
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