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Articles by author: H. Tomokage

• Behaviour of Substitutional Gold in Silicon
  Published in: Defects in Semiconductors 14 (p139)
• Controlling Process of P Diffusion in Si Based on the Pair Diffusion Model
  Published in: Diffusion in Materials DIMAT2000 (p617)
• Defect Characterization in Metal-Oxide-Semiconductor Field-Effect-Transistors with Trench Gates by Electron Beam-Induced Current Technique
  Published in: Beam Injection Assessment of Defects in Semiconductors (p407)
• Field Emission Characteristics of Plasma Enhanced Chemical Vapor Deposited Diamond-Like Carbon Films Using Scanning Probe Measurements
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p191)
• Scanning Probe Field Emission Current Measurements on Polycrystalline Diamond Films
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p177)
• Surface Characterization of Plasma Etched DLC Films by Scanning Tunneling Microscopy and Atomic Force Microscopy
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p183)