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CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by author: Hiroshi Harima
16 papers on 2 pages:
1
[2]
[next]
A Raman Study of Metal-SiC Interface Reactions
Published in:
Silicon Carbide and Related Materials 2001
(p637)
Anisotropy of Electron Mobility in n-Type 15R-SiC Studied by Raman Scattering
Published in:
Silicon Carbide and Related Materials 2003
(p621)
Carrier Density Evaluation in P-Type SiC by Raman Scattering
Published in:
Silicon Carbide and Related Materials - 1999
(p607)
Crystal Growth of 15R-SiC Boules by Sublimation Method
Published in:
Silicon Carbide and Related Materials - 1999
(p115)
Defect Formation Mechanism of Bulk SiC
Published in:
Silicon Carbide, III-Nitrides and Related Materials
(p41)
Electrical Properties of 3C-SiC Grown on Si by CVD Method using Si
2
(CH
3
)
6
Published in:
Silicon Carbide and Related Materials - 1999
(p711)
Electronic Properties of Doped SiC at Elevated Temperatures Studied by Raman Scattering
Published in:
Silicon Carbide, III-Nitrides and Related Materials
(p449)
Mechanism of Various Defects Formation in Epitaxial Layer Prepared by Sublimation Epitaxy
Published in:
Silicon Carbide and Related Materials - 1999
(p217)
Polytype and Defect Control of Two Inch Diameter Bulk SiC
Published in:
Silicon Carbide and Related Materials - 1999
(p485)
Raman Determination of Stresses and Strains in 3C-SiC Films Grown on 6-Inch Si Substrates
Published in:
Silicon Carbide, III-Nitrides and Related Materials
(p669)
Raman Image Study of Defects in Ion-Implanted and Post-Annealed Silicon
Published in:
Defects in Semiconductors 18
(p1547)
Raman Imaging Characterization of Electric Properties of SiC Near a Micropipe
Published in:
Silicon Carbide and Related Materials - 1999
(p603)
Raman Microprobe Measurement of Under-Damped LO-Phonon-Plasmon Coupled Mode in n-Type GaN
Published in:
Silicon Carbide, III-Nitrides and Related Materials
(p1363)
Raman Microprobe Study of Carrier Density Profiles in Modulation-Doped 6H SiC
Published in:
Silicon Carbide and Related Materials 2001
(p633)
Raman Spectral Profiles of Folded Longitudinal Modes in SiC under Off-resonant Condition
Published in:
Silicon Carbide and Related Materials - 1999
(p591)
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