Papers by Author: Howard R. Huff

Paper TitlePage

Enhanced Surface Preparation Techniques for the Si/High-k Interface
Authors: Joel Barnett, Chadwin D. Young, Naim Moumen, Gennadi Bersuker, Jeff J. Peterson, George A. Brown, Byoung Hun Lee, Howard R. Huff
11
The Effect of Intrinsic Point Defects upon Dislocation Motion in Silicon
Authors: I.V. Peidous, K.V. Loiko, D.A. Simpson, W.R. Frensley, Howard R. Huff
219
Chemical Processing and Materials Compatibility of High-K Dielectric Materials for Advanced Gate Stacks
Authors: J.J. Guan, Glenn W. Gale, G. Bersuker, M. Jackson, Howard R. Huff
19
Silicon Materials and Metrology: Critical Concepts for Optimal IC Performance in the Gigabit Era
Authors: Howard R. Huff, R.K. Goodall
65
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