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Articles by author: J.H. Evans-Freeman

• Cell Attachment and Proliferation on Hydroxyapatite and Ion Substituted Hydroxyapatites
  Published in: Bioceramics 15 (p671)
• Characterisation of an SiO₂/Si Interface with Slow Positrons
  Published in: Positron Annihilation - ICPA-9 (p1451)
• Deep Level Transient Spectroscopy of Ultra Shallow Junctions in Si Formed by Implantation
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p497)
• Determination of Moisture / Water in Semiconductor Processing Liquids On-Line with the SemiChem Process Analyzer
  Published in: Ultra Clean Processing of Silicon Surfaces IV (p117)
• Erbium Related Defects in Gallium Arsenide
  Published in: Defects in Semiconductors 19 (p1551)
• High Resolution Deep Level Transient Spectroscopy of Hydrogen Interactions with Ion Implantation-Induced Defects in Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p135)
• Positron Beam Measurements on Hydrogen Implanted Silicon
  Published in: Positron Annihilation - ICPA-9 (p1447)
• Synthesis and Characterisation of Hydroxyapatite and Fluorapatite
  Published in: Bioceramics 14 (p35)
• The Effect of Annealing Unimplanted and Krypton Implanted Uranium Dioxide Using Positrons
  Published in: Positron Annihilation - ICPA-9 (p1379)
• The Role of Two-Dimensional Self-Interstitial Diffusion in Void Lattice Formation and Other Defect Phenomena in Metals
  Published in: Vacancies and Interstitials in Metals and Alloys (p869)