Papers by Author: J. Shovlin

Abstract: We report here an anisotropic increase in SiC bulk resistivity by annealing at 1150 °C, and discuss the implications for SiC devices. The increase in resistivity is resistivity dependent and can be (at least) partially reversed by a subsequent anneal at higher temperature. Ideal device performance is achievable with appropriate annealing steps during device processing.

Abstract: The impact of barrier tunneling on SiC-JBS performance is studied both experimentally and theoretically. We show that although the pinch-off effects associated with the JBS structure can significantly suppress the surface electric field, barrier tunneling still dominates the reverse behavior. Barrier tunneling determines the apparent breakdown voltage, as well as the apparent breakdown voltage vs. forward voltage drop trade-off of the JBS diode in practical applications.

Abstract: SuperFETTM MOSFETs and silicon carbide (SiC) Schottky diodes are applied to continuous conduction mode active power factor correction pre-regulators. SuperFETTM MOSFETs can reduce power losses dramatically with their extremely low RDS(ON) and fast switching. The SiC Schottky diode has virtually zero reverse recovery current and high thermal conductivity, and is close to an ideal diode for a CCM PFC circuit. Due to these outstanding switching characteristics, frequency can be increased. In this paper, the SiC Schottky diode’s and SuperFETTM MOSFET’s performance have been verified in a CCM PFC boost converter. These products can reduce the total power losses and enhance the system efficiency.