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Articles by author: K. Hiramatsu

• Charactrization of Residual Transition Metal Ions in GaN and AIN
  Published in: Defects in Semiconductors 18 (p55)
• Comparison of Different Epitaxial Lateral Overgrowth GaN Structures using SiO₂ and Tungsten Mask by Cathodoluminescence Microscopy and Micro-Raman Spectroscopy
  Published in: Silicon Carbide and Related Materials - 1999 (p1483)
• Direct Imaging of the Crystalline and Chemical Nanostructure of GA,IN-Nitrides by Highly Spatially-, Spectrally- and Time-Resolved Cathodoluminescence
  Published in: Beam Injection Assessment of Defects in Semiconductors (p221)
• Impact of Epitaxial Lateral Overgrowth on the Recombination Dynamics in GaN Determined by Time Resolved Micro-Photoluminescence Spectroscopy
  Published in: Silicon Carbide and Related Materials - 1999 (p1575)
• Nanocharacterization of Semiconductors by Scanning Photoluminescence Microscopy
  Published in: Beam Injection Assessment of Defects in Semiconductors (p151)
• Slip Casting of Basic Aqueous SiC Slurry Containing Styrene/Maleis Copolymer
  Published in: Novel Synthesis and Processing of Ceramics (p157)
• Study of Mg Associated Levels in GaN
  Published in: Semiconductor Materials and Technology (p218)