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Articles by author: Liudmila I. Fedina

• Electron Microscopy Data for Threshold Energy of Point Defect Creation in Silicon
  Published in: Defects in Semiconductors 14 (p1123)
• Interaction of Point Defects with Interstitial Clusters, Dislocations and Impurities During in SITU Electron Irradiation of Silicon Crystals in the Electron Microscope
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p235)
• Laser Crystallization of Thin a-Si Films on Plastic Substrates Using Excimer Laser Treatments
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p29)
• New Compositionally-Ordered GeSi Nano Dots Fabricated with 1250 keV Electrons
  Published in: Advanced Materials and Processing (p1195)
• On the Role of Bulk Recombination of Intrinsic Point Defects in Si and their Interaction with the Surface in the Course of {113} Defect Growth: a Kinetic Study by in situ HVEM Irradiation
  Published in: Defects and Diffusion in Semiconductors (p21)
• Oriented Silicon Films on Glass Substrates for Device Applications
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p557)
• Raman and HREM Observation of Oriented Silicon Nanocrystals Inside Amorphous Silicon Films on Glass Substrates
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p507)
• Self-Interstitial Atoms and Structure of Intrinsic Getter in Silicon Crystals
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p79)
• Self-Orientation of Silicon Nanocrystals Created under Pulse Laser Impact in Stressed α-Si:H Films on Glass Substrates
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p681)