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Articles by author: Luca Lutterotti

• Rietveld Refinement Using Debye-Scherrer Film Techniques
  Published in: European Powder Diffraction 4 (p29)
• Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction
  Published in: Textures of Materials - ICOTOM 13 (p1603)
• Texture Analysis from Diffraction Spectra
  Published in: Textures of Materials - ICOTOM 10 (p473)
• Texture Characterisation of a Porphyroblastic Pyrope
  Published in: European Powder Diffraction 3 (p731)
• Thermal Behaviour of Monoclinic Zirconia at Low Temperature by XRPD Full Pattern Analysis
  Published in: European Powder Diffraction 3 (p495)
• Thermoanalytical Characterization of a Nanograined Fe-40Al Alloy
  Published in: Metastable, Mechanically Alloyed and Nanocrystalline Materials (p395)
• X-Ray Combined QTA Using a CPS Applied to a Ferroelectric Ultrastructure
  Published in: Textures of Materials - ICOTOM 13 (p113)