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Papers by Author: M.-A. Trauwaert

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Defects in AS-Grown Silicon and their Evolution During Heat Treatments

Authors: Jan Vanhellemont, E. Dornberger, J. Esfandyari, G. Kissinger, M.-A. Trauwaert, H. Bender, D. Gräf, U. Lambert, Wilfried von Ammon

341

Study of Point Defects in Silicon by Means of Positron Annihilation with Core Electrons

Authors: Jan Kuriplach, T. van Hoecke, B. van Waeyenberge, Charles Dauwe, Danny Segers, N. Balcaen, A.L. Morales, M.-A. Trauwaert, J.R. Richardson, Mojmír Šob

605

Differential Interference Contrast Microscopy of Defects in As-Grown and Annealed Si Wafers

Authors: M.-A. Trauwaert, Jan Vanhellemont, U. Lambert, D. Gräf, Karine Kenis, Paul W. Mertens, Marc Heyns

387

On the Behaviour of the Divacancy in Silicon during Anneals between 200 and 350°C.

Authors: M.-A. Trauwaert, Jan Vanhellemont, H.E. Maes, A.-M. Van Bavel, G. Langouche, Andre Stesmans, Paul Clauws

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