Papers by Author: M. Mamor

Paper TitlePage

Processing-Induced Defects in Epitaxially Grown p- and n-Type SiGe
Authors: M. Mamor, F. Danie Auret, S.A. Goodman
161
Electronic Properties of Defects Introduced in n- and p-Type Si1-xGex During Ion Etching
Authors: S.A. Goodman, F. Danie Auret, M. Mamor, Prakash N.K. Deenapanray, W.E. Meyer
133
Electrical Characterization of Electron Beam Induced Defects in Epitaxially Grown Si1-xGex
Authors: M. Mamor, F. Danie Auret, S.A. Goodman, G. Myburg, Prakash N.K. Deenapanray, W.E. Meyer
115
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