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Articles by author: Nikolai Yarykin

• Comparative Study of Electrical and Optical Properties of Plastically Deformed Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p425)
• Defect Generation during Plastic Deformation of Si-Rich Cz-Grown SiGe Crystals
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p295)
• Electrical Properties of Dislocation Impurity Atmospheres in Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p367)
• Electrically Active Silver-Hydrogen Complexes in Silicon
  Published in: Defects in Semiconductors 19 (p301)
• Enhanced Gold Diffusion in Silicon under Intrinsic Point Defect Flow
  Published in: Defects in Semiconductors I (p227)
• Formation of Copper-Related Deep-Level Centers in Irradiated P-Type Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p154)
• Hydrogen Penetration into Si under Wet Chemical Etching: Experiment and Simulation
  Published in: Polycrystalline Semiconductors VI (p121)
• Increase of Electrical Activity of Dislocations in Si during Plastic Deformation
  Published in: Defects in Semiconductors 18 (p1183)
• In-Situ Photoexcitation-Induced Perturbations of Defect Complex Concentration and Distribution in Silicon Implanted with Light and Heavy Ions
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p397)
• Metastability of Electrical Properties of Dislocations in Silicon
  Published in: Defects in Semiconductors 15 (p1373)
• Metastable Behavior of Dislocation Charge in Space Charge Region
  Published in: Defects in Semiconductors I (p485)
• Oxygen Dimers and Related Defects in Plastically Deformed Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p161)
• Reconstruction of Deep Level Defect Distribution from DLTS Measurements in Compensated Semiconductors
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p531)
• The Electrical Activity of Dislocation Slip Planes in Semiconductor Crystals
  Published in: Defects in Semiconductors 14 (p787)