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CONFERENCE
6/16/2013 - 6/19/2013
The 7th International conference on Physical and Numerical Simulation of Materials Processing
5/16/2013 - 5/19/2013
2nd International Congress on Advanced Materials
4/13/2013 - 4/14/2013
2013 2nd lnternational Conference on lntclligent Materials, Applied Mechanics and Design Science (IMAMD 2013)
more...
Articles by author: O. Bonnaud
25 papers on 2 pages:
1
[2]
[next]
Accumulation Mode in Polycrystalline Silicon Thin-Film Transistors
Published in:
Polycrystalline Semiconductors VI
(p373)
Adaptation of Microelectronics Simulator to the Polycrystalline Silicon Technology
Published in:
Polycrystalline Semiconductors V
(p131)
Behavior of Polysilicon Thin-Film Transistors at Different Temperatures
Published in:
Polycrystalline Semiconductors VII
(p67)
Desorption Energy of Oxygen Adsorbed on Un-Intentionally Doped Low Pressure Chemical Vapor Deposited Silicon Films
Published in:
Polycrystalline Semiconductors III
(p151)
Effect of Pressure and Temperature on the Electrical Properties of LPCVD Silicon-Germanium Thin Films
Published in:
Polycrystalline Semiconductors VI
(p89)
Electrical Properties of High Value Doped Polysilicon-Based Resistors
Published in:
Polycrystalline Semiconductors VII
(p435)
Experimental Determination of Hall Factor for Hydrogenated In-Situ Phosphorus Doped Polysilicon Films
Published in:
Polycrystalline Semiconductors IV
(p379)
Influence of the Polysilicon Film Structure on the Capacitance Voltage Characteristics of Thin Film Transistors
Published in:
Polycrystalline Semiconductors III
(p589)
Influence of Thermal Treatments on the Crystallisation of LPCVD-Deposited Si Thin Films
Published in:
Polycrystalline Semiconductors VI
(p199)
Leakage Current of Unhydrogenated Solid Phase Crystallized Silicon Thin Film Transistors
Published in:
Polycrystalline Semiconductors V
(p541)
Modelling of the Doping Effect on the Capacitance of the Metal/N-Polysilicon/Oxide/N-Silicon Structure
Published in:
Polycrystalline Semiconductors V
(p559)
Morphological Characterization of Polysilicon Films Laser-Annealed in Argon Ambient
Published in:
Polycrystalline Semiconductors VI
(p175)
Nanocrystalline Silicon Carbide: Structure, Properties and Application to SiC/Si Heterostructure Devices
Published in:
Polycrystalline Semiconductors VI
(p397)
Numerical Modeling and Simulation of Output Parameters in Poly-Si Homojunction nip (or pin) Solar Cells
Published in:
Polycrystalline Semiconductors VI
(p317)
Physical Properties of Polysilicon Diodes Derived from a Smart Power Technology
Published in:
Polycrystalline Semiconductors IV
(p567)
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