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Articles by author: O.V. Kononchuk

• Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers
  Published in: Beam Injection Assessment of Defects in Semiconductors (p61)
• Formation of Electrical Activity of Dislocations in Si during Plastic Deformation
  Published in: Polycrystalline Semiconductors IV (p15)
• Increase of Electrical Activity of Dislocations in Si during Plastic Deformation
  Published in: Defects in Semiconductors 18 (p1183)
• Measurements of Diffusion Length in Si-SiGe Structures
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p601)
• Metallic Impurity Gettering in MeV Implanted Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p69)
• Processes of Defect Formation and Gettering under Dry Etching of Si and GaAs and Measurements of Diffusion Length Profile
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p99)
• Reconstruction of the Recombination Centre Distribution in Dislocation Impurity Atmosphere in Si
  Published in: Polycrystalline Semiconductors IV (p123)