Papers by Author: O.V. Kononchuk

Paper TitlePage

Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers
Authors: O.V. Kononchuk, I.E. Bondarenko, George A. Rozgonyi
61
Metallic Impurity Gettering in MeV Implanted Si
Authors: O.V. Kononchuk, R.A. Brown, Sergei V. Koveshnikov, K.L. Beaman, F. Gonzalez, George A. Rozgonyi
69
Reconstruction of the Recombination Centre Distribution in Dislocation Impurity Atmosphere in Si
Authors: I.E. Bondarenko, O.V. Kononchuk, V. Sirotkin
123
Formation of Electrical Activity of Dislocations in Si during Plastic Deformation
Authors: O.V. Kononchuk, V. Orlov, Olga V. Feklisova, Eugene B. Yakimov
15
Increase of Electrical Activity of Dislocations in Si during Plastic Deformation
Authors: O.V. Kononchuk, V. Orlov, Olga V. Feklisova, Eugene B. Yakimov, Nikolai Yarykin
1183
Measurements of Diffusion Length in Si-SiGe Structures
Authors: O.V. Kononchuk, George A. Rozgonyi, Eugene B. Yakimov
601
Processes of Defect Formation and Gettering under Dry Etching of Si and GaAs and Measurements of Diffusion Length Profile
Authors: O.V. Kononchuk, Eugene B. Yakimov
99
Showing 1 to 7 of 7 Paper Titles