HomeP. Schley

Papers by Author: P. Schley

Paper TitlePage

Impact of Defects on the Leakage Currents of Si/SiGe/Si Heterojunction Bipolar Transistors

Authors: D. Wolansky, G.G. Fischer, D. Knoll, D. Bolze, Bernd Tillack, P. Schley, Y. Yamamoto

249

Characterization of MBE Grown Si/Si_1-xGe_x/Si Structures Using n⁺p-Diodes

Authors: K. Schmalz, H. Rücker, Hermann G. Grimmeiss, B. Dietrich, H. Frankenfeld, W. Mehr, H.J. Osten, P. Schley

595

The Influence of Oxidation Induced Stacking Faults on Electrical Parameters of a CCD Device

Authors: P. Schley, G. Kissinger, R. Barth, K.-E. Ehwald

353

Defect Engineering for Bicmos-Technology

Authors: G. Ritter, K.-E. Ehwald, P. Schley

57