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Papers by Author: Petra Pernot-Rejmánková

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Investigation of Structural Defects during 4H-SiC Schottky Diode Processing by Synchrotron Topography

Authors: Etienne Pernot, E. Neyret, Cécile Moulin, Petra Pernot-Rejmánková, Francois Templier, Lea Di Cioccio, Thierry Billon, Roland Madar

419

X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide

Authors: Etienne Pernot, Michel Mermoux, J. Kreisel, O. Chaix-Pluchery, Petra Pernot-Rejmánková, Mikhail Anikin, Bernard Pelissier, A.M. Glazer, Roland Madar

283

SiC Single Crystal Growth by Sublimation: Experimental and Numerical Results

Authors: Cécile Moulin, Michel Pons, Alexander Pisch, Philippe Grosse, Christian Faure, Alain Basset, Gérard Basset, Antoine Passero, Thierry Billon, Bernard Pelissier, Mikhail Anikin, Etienne Pernot, Petra Pernot-Rejmánková, Roland Madar