Articles by author: Ph. Ebert
3 papers on 1 page:
1
-
Combination of Positron Annihilation and Scanning Tunneling Microscopy: A Unique Approach to Characterize Defects
Published in: Positron Annihilation - ICPA-11 (p494) -
Imaging and Characterizing Nanoscale Fluctuations in the Distribution of Dopant Atoms by Scanning Tunneling Microscopy
Published in: Defects and Diffusion in Semiconductors - An Annual Retrospective VII (p111) -
Positron Annihilation and Scanning Tunneling Microscopy Used to Characterise Defects in Highly Si-Doped GaAs
Published in: Defects in Semiconductors 19 (p885)