HomePh. Ebert

Papers by Author: Ph. Ebert

Paper TitlePage

Imaging and Characterizing Nanoscale Fluctuations in the Distribution of Dopant Atoms by Scanning Tunneling Microscopy

Authors: Ph. Ebert

111

Positron Annihilation and Scanning Tunneling Microscopy Used to Characterise Defects in Highly Si-Doped GaAs

Authors: J. Gebauer, Reinhard Krause-Rehberg, C. Domke, Ph. Ebert, K. Urban

885

Combination of Positron Annihilation and Scanning Tunneling Microscopy: A Unique Approach to Characterize Defects

Authors: J. Gebauer, Reinhard Krause-Rehberg, C. Domke, Ph. Ebert, K. Urban

494