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CONFERENCE
12/9/2012 - 12/12/2012
ACAM7: The 7th Australasian Congress on Applied Mechanics
11/16/2012 - 11/18/2012
2nd International Conference on Manufacturing Engineering and Automation (ICMEA2012)
11/16/2012 - 11/18/2012
more...
Articles by author: R.C. Newman
36 papers on 3 pages:
1
[2]
[3]
[next]
A Metastable Precursor to the Di-Carbon Centre in Crystalline Silicon
Published in:
Defects in Semiconductors 15
(p481)
A Piezo-Spectroscopic Study of Oxygen-Vacancy Centers in Silicon
Published in:
Defects in Semiconductors 17
(p969)
An Investigation of the 78/203 meV Double Acceptor in GaAs Including the Effects of Hydrogen Passivation
Published in:
Shallow Impurities in Semiconductors IV
(p175)
Carbon and Silicon Impurity Centers in GaAs
Published in:
Shallow Impurities in Semiconductors V
(p45)
Carbon Delta-Doping In GaAs and AlAs
Published in:
Defects in Semiconductors 18
(p409)
De-Alloying and Stress-Corrosion Cracking of Copper Alloys in Cu(I) Solutions
Published in:
Electrochemical Methods in Corrosion Research III
(p169)
Disorder and Structural Relaxation in Passive Films on Fe-Cr Alloys
Published in:
Passivation of Metals and Semiconductors
(p233)
Effect of Oxygen Concentration on the Kinetics of Oxygen Loss and Thermal Donor Formation in Silicon at Temperatures between 350° C and 500° C
Published in:
Gettering and Defect Engineering in Semiconductor Technology
(p161)
Electrochemical Kinetics in Localized Corrosion Cavities
Published in:
Electrochemical Methods in Corrosion Research III
(p247)
Electronic and Vibrational Absorption of Interstitial Carbon in Silicon
Published in:
Defects in Semiconductors 14
(p929)
Enhanced Oxygen Diffusion in Silicon at Low Temperatures
Published in:
Defects in Semiconductors 14
(p887)
Ga Antisite Defects in Neutron Irradiated and Annealed GaAs?
Published in:
Defects in Semiconductors 14
(p1081)
Hydrogen Solubility and Defects in Silicon
Published in:
Defects in Semiconductors 17
(p861)
Incorporation of Silicon in (311)A and (111)A GaAs Grown by Molecular Beam Epitaxy
Published in:
Defects in Semiconductors 17
(p259)
Infrared and Raman Studies of Carbon Impurities in Highly Doped MBE AlAs:C
Published in:
Defects in Semiconductors 17
(p247)
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