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Articles by author: Salvatore Lombardo

• Current Transport by Defects in Pr₂O₃ High K Films
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p717)
• Electron Transport and Dielectric Breakdown Kinetics in Pr₂O₃ High K Films
  Published in: Mass and Charge Transport in Inorganic Materials III (p21)
• Memory Effects in Single-Electron Nanostructures
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p669)
• Nanocrystal MOS Memories Obtained by LPCVD Deposition of Si Nanograins
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p663)
• Nanocrystal MOS with Silicon-Rich Oxide
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p675)
• Role of H₂ in Low Temperature Post-Oxidation Anneal for Gate Oxide on 6H-SiC
  Published in: Silicon Carbide and Related Materials 2000 (p639)
• Ultra Low-Level Ion Implantation Damage Detected by p-n Junctions Biased above Breakdown
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p431)