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Articles by author: Siegmund Greulich-Weber

• A New Model for the D_I-Luminescence in 6H-SiC
  Published in: Silicon Carbide and Related Materials 2004 (p465)
• Annealing Study on Radiation-Induced Defects in 6H-SiC
  Published in: Silicon Carbide and Related Materials 2003 (p517)
• Bottom-Up Routes to Porous Silicon Carbide
  Published in: Silicon Carbide and Related Materials 2008 (p637)
• Carbon Related Split-Interstitials in Electron-Irradiated n-type 6H-SiC
  Published in: Silicon Carbide and Related Materials 2005 (p551)
• Electrical Detection of Electron Paramagnetic Resonance: Studies of the Mechanism of the Spin-Dependent Recombination Process
  Published in: Defects in Semiconductors 18 (p1509)
• Electrically Detected Electron Paramagnetic Resonance
  Published in: Defects in Semiconductors 17 (p1337)
• Electron Paramagnetic Resonance of the Scandium Acceptor in 4H and 6H Silicon Carbide
  Published in: Silicon Carbide and Related Materials - 1999 (p809)
• Endor and ODEPR Investigation of the Microscopic Structure of the Boron Acceptor in 6H-SiC
  Published in: Defects in Semiconductors 17 (p63)
• EPR and ENDOR of Defects in Silicon Carbide
  Published in: Defects in Insulating Materials (p149)
• EPR, ESE and Pulsed ENDOR Study of Nitrogen Related Centers in 4H-SiC Wafers Grown by Different Technologies
  Published in: Silicon Carbide and Related Materials 2006 (p355)
• Fine Structure of Triplet Centers in Room Temperature Irradiated 6H-SiC
  Published in: Silicon Carbide and Related Materials 2009 (p403)
• Growth of Phosphorus-Doped 6H-SiC Single Crystals by the Modified Lely Method
  Published in: Silicon Carbide and Related Materials - 2002 (p63)
• Luminescence and EPR Characterization of Vanadium Doped Semi-Insulating 4H SiC
  Published in: Silicon Carbide and Related Materials 2005 (p651)
• Magnetic Circular Dichroism and Optically Detected EPR of a Vanadium Impurity in 6H-Silicon Carbide
  Published in: Defects in Semiconductors 17 (p75)
• Magneto-Optical Properties of Fe-Al Pairs in Silicon and the Discovery of a New Trigonal (Fe_i-Al_s)⁰ Pair
  Published in: Defects in Semiconductors 16 (p149)