Authors: Hanabusa Takao, Ayumi Shiro, Tatsuya Okada
Abstract: Residual stresses of a copper bicrystal were measured by X-ray diffraction and synchrotron
radiation. A copper bicrystal specimen with a 90-degree tilt boundary was fabricated by the Brigdman
technique. After the plastic extension of 30%, kink bands developed in a deformed matrix along the
grain boundary. In this study, we focused on the residual stress distribution along the transverse direction
of the specimen surface and the residual stresses in deformed matrix and kink band near the grain
boundary. Residual stresses were evaluated by the X-ray single crystal measurement method.
Stereographic projections were used to determine crystal orientations of deformed regions. It was found
that crystal orientations were different between the deformed matrix and the kink band. Residual stresses
in the direction along the grain boundary were compressive in the vicinity of the boundary and tensile in
the region apart from the boundary. Residual stresses in the kink band were large in compression in
compared with those in the deformation matrix. The difference in the results between X-rays and
synchrotron radiation suggests that there is a depth variation in the deformation and therefore the residual
stress development.
125
Authors: Ayumi Shiro, Hanabusa Takao, Tatsuya Okada, Nishida Masayuki, Kazuya Kusaka, Osamu Sakata
Abstract: Residual stresses near the grain boundary of a bicrystal were measured by synchrotron radiation of SPring-8 at Japan Synchrotron Radiation Research Institute. A copper bicrystal specimen with a 90-degree tilt boundary was deformed 30% in tension. After the plastic extension, kink bands developed in a deformed matrix along the grain boundary. In this study, we focused on the residual stresses in the deformed matrix and the kink band. Residual stresses were evaluated by the X-ray single crystal measurement method. Stereographic projections were used to determine crystal orientations of deformed regions. Our observation showed that crystal orientations were different between the deformed matrix and the kink band. Residual stresses in the direction along the grain boundary in the deformed matrix and kink band were compressive. Residual stresses in the direction vertical to the grain boundary were seen opposite between the deformed matrix and the kink band.
515
Authors: Hiroyuki Kawahara, Tatsuya Okada, Ryota Kumai, Takuro Tomita, Shigeki Matsuo, Shuichi Hashimoto, Makoto Yamaguchi
Abstract: We carried out cross-sectional transmission electron microscopy (TEM) investigation of
femtosecond laser-induced ripples formed on 4H-SiC single crystal surface. Here, we paid attention
to the crystal structures underlying the coarse and fine ripples and the three-dimensional distribution
of amorphous phase. Conventional and high-resolution TEM analyses made clear that a continuous
amorphous layer approximately of 50 nm thick exist at the topmost region of both coarse and fine
ripples. The result strongly suggests that the fundamental surface deformation process is common for
coarse and fine ripples, even though the factors which determine their periods are different.
883
Authors: F. Inoko, Keizo Kashihara, Tatsuya Okada, M. Tagami
Abstract: It is shown using aluminum single crystals with kink bands like a plate through the depth
that the nucleation and growth of recrystallized grains (RGs) on/in the surface precede those in the
interior.
2431
Authors: Tatsuya Okada, Kouichi Okamoto, Kengo Ochi, Kouichi Higashimine, Tsunenobu Kimoto
Abstract: Plan-view transmission electron microscopy (TEM) was applied to investigate the origin of
surface defects in 4H-SiC homoepitaxial films. Their origin existed at the substrate/epi-film interface.
Hence, almost the entire thickness of the epi-film was removed by plasma etching leaving a very thin
film. Then, the etched epi-crystal was thinned from the substrate side so that we could observe the
crystallographic imperfections at the substrate/epi-film interface in plan-view TEM. Morphological
features of the epi-film surface remained unchanged after the plasma etching process. Hence,
one-to-one correspondence between surface defects and crystallographic imperfections was
confirmed by comparing optical micrographs and TEM images. Crystallographic imperfections
associated with “carrot defects” were observed. They were composed of stacking faults on the (0001)
plane and partial dislocations bounding them. These imperfections originated from foreign particles
at the interface. From X-ray energy-dispersive spectrometry (XEDS), it was confirmed that particles
contained zirconium (Zr). Selected area diffraction patterns showed that the particles were
crystalline.
399
Authors: Takuro Tomita, Shigeki Matsuo, Tatsuya Okada, Tsunenobu Kimoto, Takeshi Mitani, Shinichi Nakashima
Abstract: Deep-ultraviolet (DUV) micro-Raman spectroscopy was applied to study the micro
structures of surface defects in a 4H-SiC homoepitaxially grown film. From DUV Raman spectrum,
inclusions of 3C-SiC was found in comet defects. The shape of 3C-structure in comets was
investigated and it was found that 3C inclusions in comets can be classified into two types. In addition,
spectrum broadening due to the coupling of nonfolded longitudinal optical phonon mode and the
photo-excited carriers was also found. The formation mechanisms of 3C inclusion in comets were
discussed.
339
Authors: F. Inoko, Keizo Kashihara, M. Tagami, Tatsuya Okada
57
Authors: M X Pan, Wei Hua Wang, Yong Hu, De Qian Zhao, Yan Hui Zhao, Tatsuya Okada, W. Utsumi
53
Authors: Tatsuya Okada, Tsunenobu Kimoto, K. Yamai, Hiroyuki Matsunami, F. Inoko
521