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Articles by author: V.G. Litovchenko

• An Express Method for the Study of Planar Homogeneity of Diffusion Lenght in Multicrystalline Solar Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p449)
• Computer Modelling of SiO₂ Precipitation in Cz-Si Doped with Nitrogen
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p405)
• Computer Simulation of Gettering Induced Oxygen Redistribution in SOI Structures
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p273)
• Defects in CdTe Induced by Powerful Laser Radiation
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p575)
• Effect of Grown-In Defects on the Structure of Oxygen Precipitates in Cz-Si Crystals with Different Diameter
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p405)
• Effective Gettering Mechanisms in Solar Multicrystalline Materials
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p719)
• Gettering Processes for the Preparation of Silicon Solar Cell Material
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p285)
• Mechanism of Generation of Defects in a Semiconductor by Pulse Laser Radiation
  Published in: Ultrafast Phenomena in Semiconductors 2001 (p291)
• Radiation Induced Transformation of Impurity Centers in the Gate Oxide of Short-Channel SOI MOSFETS
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p469)
• SiC Buried Layer Formation Induced by Ion Implantation
  Published in: Gettering and Defect Engineering in Semiconductor Technology VI (p211)
• Stimulated Creation of the SOI Structures with Si Nano-Clustersw by Low–Dose SIMOX Technology
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIV (p17)
• Study of the Mechanisms of Oxygen Precipitation in RTA Annealed Cz-Si Wafers
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p279)
• The Properties of the Defects in Heavy Implanted Silicon
  Published in: Gettering and Defect Engineering in Semiconductor Technology (p79)
• Use of Gettering and Defect Induced Processes in Ultra-Thin Buried Oxide Synthesis
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p97)