Authors: Y.A. Danilov, B.N. Zvonkov, Alexei V. Kudrin, O.V. Vikhrova, S.M. Plankina, V.S. Dunaev, A.V. Nezhdanov, Y.N. Drozdov
Abstract: t is reported about fabrication by laser deposition in a gaseous environment of epitaxial layers of ferromagnetic semiconductors GaMnSb and InMnSb. Investigations of x-ray diffraction and Raman scattering showed reasonably good crystal quality of GaMnSb and InMnSb layers. Magnetic properties were investigated by magneto-optical transversal Kerr effect and Hall effect. It is established, that GaMnSb layers are ferromagnetic at room temperature. In contrast, InMnSb samples demonstrate the ferromagnetic properties only at low temperatures (< 70 K).
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Authors: M.V. Dorokhin, Y.A. Danilov, Alexei V. Kudrin, E.I. Malysheva, M.M. Prokof’eva, B.N. Zvonkov
Abstract: The electroluminescence properties of ferromagnetic GaMnSb/GaAs diodes have been investigated. It has been found that diodes properties are significantly dependent on GaMnSb layer electrical properties. The intensity of electroluminescence of the diode with semiconductor GaMnSb contact is relatively low, that is due to a high potential barrier at the interface. In case of metallic GaMnSb/GaAs contact high hole injection efficiency provides relatively high electroluminescence intensity. Investigated light-emitting diodes can be prospective for investigation of spin injection effects.
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Authors: E.A. Gan'shina, L.L. Golik, V.I. Kovalev, Z.E. Kun’kova, M.P. Temiryazeva, Y.A. Danilov, O.V. Vikhrova, B.N. Zvonkov, A.I. Novikov, A.N. Vinogradov
Abstract: Optical and magneto-optical properties of GaMnSb layers fabricated on GaAs (001) substrates by laser ablation technique were studied using spectral ellipsometry (E =1.24-3.25 eV) and the transversal Kerr effect (TKE) (E = 0.5 4.2 eV) as well as atomic and magnetic force microscopy. Spectra of the constituents of the diagonal components of the permittivity tensor as well as TKE depended substantially on the layer fabrication conditions. At room temperature a strong resonant band was observed in the TKE spectra for the GaMnSb layers with low Mn content in the energy range E 0.5-1.5 eV. This resonant TKE band was explained by excitation of surface plasmons in MnSb nanoclusters, which arose during the growth of the layers. In the energy region E >1.5 eV the TKE spectra were related to interband transitions in MnSb inclusions.
562
Authors: Y.A. Danilov, Alexei V. Kudrin, O.V. Vikhrova, B.N. Zvonkov
Abstract: Laser deposition method was used for growing ferromagnetic semiconductor and half-metal compound layers. GaMnAs and InMnAs layers were grown by alternating laser ablation of solid targets (semiconductor and Mn) in hydrogen and arsine flow. The layers exhibited ferromagnetic properties (detected by Hall effect measurements) from 10 K to room temperature (for InMnAs). Half-metal compound layers were deposited by the techniques of reactive laser deposition (MnAs, MnP) and alternating laser deposition (MnSb). The half-metal layers exhibit ferromagnetism at temperatures up to 300 K.
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Authors: Y.A. Danilov, Y.N. Drozdov, M.V. Dorokhin, V.D. Kulakovskii, M.M. Prokof’eva, S.V. Zaitsev, B.N. Zvonkov
Abstract: Circularly polarized electroluminescence from light-emitting diodes based on InGaAs/GaAs heterostructures with adjacent ferromagnetic delta-doped layer has been investigated. It was found that delta-layer placed near (at 2-10 nm) the quantum well (QW) causes circular polarization of its electroluminescence due to an s,p-d exchange interaction between holes in the quantum well and Mn ions in the delta-layer. The dependence of circular polarization degree on main technology parameters is discussed.
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Authors: E.A. Gan'shina, L.L. Golik, V.I. Kovalev, Z.E. Kun’kova, M.P. Temiryazeva, Y.A. Danilov, O.V. Vikhrova, B.N. Zvonkov, A.D. Rubacheva, P.N. Tcherbak, A.N. Vinogradov
Abstract: Optical and magneto-optical properties of In(Ga)MnAs layers fabricated by laser ablation on GaAs(100) substrates were studied. Spectra of the optical constants and the transversal Kerr effect (TKE) depended substantially on the conditions of layer fabrication and testified to the presence of MnAs inclusions in all the samples. The cross-sectional transmission electron microscopy revealed the presence in the layers of inclusions 10-40 nm in size. At room temperature, a strong resonant band was observed in the TKE spectra of some In(Ga)MnAs layers in the energy range 0.5-2.7 eV. The resonant character of the TKE spectra was explained by excitation of surface plasmons in the MnAs nanoclusters embedded in the semiconductor host.
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