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Papers by Author: Zbigniew J. Radzimski

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Application of Gate Oxide Integrity to the Evaluation of the Efficiency of Internal and External Gettering Sites in Si Wafers

Authors: Sergei V. Koveshnikov, David Beauchaine, Zbigniew J. Radzimski, Li Ling, K.V. Ravi

393

The Future of Beam Injection Techniques: Summary of the Round-Table Discussion Held at BIADS 98

Authors: A. Endrös, A. Jakubowicz, Zbigniew J. Radzimski

529

Electron Beam Induced Current Imaging of Silicon Oxide Damage Due to Reactive Ion Etching

Authors: Hary Kirk, Zbigniew J. Radzimski, A. Romanowski, George A. Rozgonyi

359

Defect Electrical Activity Study Using a Si(Ge) Heteroepitaxial Structure

Authors: Zbigniew J. Radzimski, A. Buczkowski, George A. Rozgonyi

309