Authors: Juan Juan Qian, Xiao Yan Wang, Xi Yun He, Ping Sun Qiu, Da Zhi Sun
Abstract: Ba0.6Sr0.4TiO3 materials doped with boron family Al3+, Ga3+ and In3+ are prepared by a ceramic process. The specimens possess condense microstructures. A low dielectric loss is achieved in the sample doped with In3+. Dielectric constants increase with decrease of the radii of doped ions. The results are discussed with respect to the interaction between oxygen ions and ions at B-site in ABO3 perovskite, which is revealed by Fourier transform infrared spectrum.
748
Authors: Takashi Nishida, Takashi Nozaka, Takuya Tsuchikawa, Masahiro Echizen, Hiroaki Takeda, Kiyoshi Uchiyama, Tadashi Shiosaki
Abstract: (Ba,Sr)TiO3 (BST) thin films have been investigated because of significant interest in device
applications of their nonlinear dielectric properties such as in frequency tunable devices. We have
investigated frequency conversion devices using BST films as new nonlinear devices, such as
frequency mixers and multipliers. In this paper, we report the evaluation of nonlinear properties of
various capacitors, and the experimental equation of the properties and the equivalent circuit model
for frequency converters were established. A frequency multiplier using the BST film capacitor was
fabricated, and obvious third harmonic signals could be observed. A conversion efficiency of -20
dB was obtained with a low input power of 0.25 W. Analysis of the converter with an equivalent
circuit was also carried out, and the calculated output voltage agreed well with the measured result.
The model is expected to be used for the analysis and improvement of conversion devices.
183
Authors: Daniel Popovici, Hiroki Tsuda, Jae Hyuk Park, Jun Akedo, Masanori Okuyama
Abstract: (Ba0.6,Sr0.4)TiO3 thick films have been fabricated on various substrates and their physical and
electrical properties were analyzed. The effect of primary powder condition on the quality of the
BST fabricated films using aerosol deposition technique has been investigated keeping in mind
results shown in the literature for BST films fabricated with classical deposition techniques.
Presence of carbonates and TiO2 has been demonstrated by XPS analysis and the leakage current
behavior has linked to the presence of TiO2 at the grain boundaries. The films showed good
insulating properties, with small leakage densities being on the order of 10-6 A/cm2 for an applied
electric field of 150 kV/cm.
163
Authors: Jia Xuan Liao, C.R. Yang, J.H. Zhang, H. Chen, C.L. Fu, W.J. Leng
Abstract: Ba0.6Sr0.4TiO3 (BST) thin films deposited on Pt/Ti/SiO2/Si substrates by radio frequency
magnetron sputtering and crystallized by rapid thermal annealing (RTA) exhibit much thinner BST/Pt
interfacial transition layer and higher dielectric properties than the films crystallized by conventional
thermal annealing (CTA). HRTEM observations show that the transition layer is 2-3nm thick for RTA
and 4-5nm thick for CTA. XPS investigations display that the transition layer is composed of perovskited
BST phase and non-perovskited BST phase, and RTA corresponds to much less non-perovskited BST
phase than CTA. The reason for non-perovskited BST phase and the dielectric properties of BST films are
also presented.
374
Authors: Xiao Hong Wang, Wen Zhong Lu, Gui Fen Fan, Dong Xiang Zhou
Abstract: The effects of cerium oxide on the dielectric properties and tunable properties of barium
strontium titanate/magnesia (40wt%Ba0.6Sr0.4TiO3-60wt%MgO) compound ferroelectric material for
improving the properties of phase shifter were investigated. The mechanism was also presented and
discussed. The XRD patterns analysis showed that with increasing quantities of cerium oxide x (wt%), the
lattice constant of BST-MgO material first increased to x=0.4, then changed a little till x=1.2. Further
additions of CeO2 decreased the lattice constant. The dielectric properties at 10 kHz and microwave
frequency were studied. The addition of CeO2 influences the dielectric constant, loss tangent and
tunability greatly. The permittivity decreased with increase of cerium oxide nearly linearly. The addition
of CeO2 effectively decreased the loss in BSTM ceramic. Optimum doping amount of CeO2 reduced the
high frequency loss tangents of BST-MgO compound which also ensured the moderate dielectric constant
and tunability. When the doping amount of CeO2 is 1.2wt%, BST-MgO composite has the following
properties: εr = 92.64, tanδ = 0.00449 (at 2.6166 GHz) and tunability = 9.67% (at 2kV/mm), it is suitable
for ferroelectric phase shifter.
275
Authors: Jing Yun Ma, Hong Yan Miao, Guo Qiang Tan, Zheng Qiu Sun
Abstract: Barium strontium titanate (BST) ferroelectric thin films have been successfully prepared on the
single crystal silicon substrates using hydrothermal crystallization of sol-gel precursor, which combined
the conventional sol-gel process and the hydrothermal method. The precursor film was deposited by the
dip-coating method. The multiplayer BST gel films were hydrothermally treated in a Teflon vessel at low
temperature of 160-180 °C for 1-3.5 h. The influences of the reaction conditions on the structure and
crystallizing degree of BST thin films were discussed. We find that the temperature of as-dried gel films
and post hydrothermal treatment are the critical parameters determining the quality of formation of BST
thin films. Under optimized conditions, we can obtain well-developed perovskite BST films with smooth
and pinhole-free surfaces. These results reveal that this technique is a promising low temperature process
for the fabricating of thin films.
95
Authors: Rong Wu, Pi Yi Du, Wen Jian Weng, Gao Rong Han
Abstract: BST/PLT composite thick films with various content of PbO-B2O3 glass additive from 5mol% to 25mol% were successfully prepared by screen-printing the paste onto alumina substrates. XRD, SEM and impedance meter were used to analyze the phase structures, morphologies and dielectric properties of the thick films. The results showed that the BST phase has no interaction with PbO-B2O3 glass in the
composite thick films at 750 oC. Diffusion between PLT phase and PbO-B2O3 glass phase occurs and the c axis of PLT phase in thick films reduces slightly. The high infiltration between the glass phase and particles densify the composite thick films and the uniform microstructure can be obtained in the thick films with PbO-B2O3 glass additive content of 10mol%. Good temperature stability of dielectric
properties is achieved with the 25mol% content of PbO-B2O3 glass additive and the variance of the relative dielectric constant in the temperature range between 0oC and 300oC is 15%.
99
Authors: Alexander Deyneka, Zdenek Hubička, V.A. Trepakov, Gunnar Suchaneck, Lubomir Jastrabik, Gerald Gerlach, Jan Pokorny, Dasgmar Chvostova, J. Olejníček
Abstract: Technology aspects and characterization of BaxSr1-xTiO3 (BST) films fabricated with low pressure plasma jet technique are presented. BST films were deposited on silicon coated with Pt/TiO2/SiO2 and on bare Si substrates. The nozzles-type RF hollow cathode has been fabricated from hot pressed BaTiO3, SrTiO3, and BST ceramics. Controlling of RF voltage, RF current and substrate temperature allowed us to deposit reproducible films with controlled grain size. Hysteresis
loops, ellipsometric and micro-Raman investigation results are presented and discussed.
165
Authors: J.S. Kim, B.H. Park, T.J. Choi, Se Hyun Shin, Jae Chul Lee, Man Jong Lee, S.A. Seo, I.K. Yoo
Abstract: Pb0.65Ba0.35ZrO3 (PBZ) thin films have been grown on MgO (001) substrates by pulsed-laser deposition (PLD). We have compared the structural and dielectric properties of PBZ films grown at various temperatures. A highly c-axis orientation has appeared at PBZ film grown at the deposition temperature of 550oC. The c-axis oriented PBZ film has also shown the largest tunability among all the PBZ films in capacitance-voltage measurements. The tunability and dielectric loss of the PBZ film was 20% and 0.00959, respectively. In addition, we have compared the
temperature coefficient of capacitance (TCC) of a PBZ film with that of a Ba0.5Sr0.5TiO3 (BST) film which is a well-known material applicable to tunable microwave devices. We have confirmed that TCC value of a PBZ thin film was three-times smaller than that of a BST thin film.
1313
Authors: M. Özenbaş, N. Özgüven, M.B. Emre, M.V. Demirbaş
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