HOME CONTACT My eBook

Username: Password:

> @scientific.net

Articles by keyword: «Carrier Recombination»

• Dense Electron-Hole Plasma Effects on Energy Relaxation in Highly Excited Polar Semiconductors
  Published in: Ultrafast Phenomena in Semiconductors (p99)
• Impact of SiC Structural Defects on the Degradation Phenomenon of Bipolar SiC Devices
  Published in: Silicon Carbide and Related Materials - 2002 (p917)
• Investigation of Electroluminescence across 4H-SiC p⁺/n^-/n⁺ Structures Using Optical Emission Microscopy
  Published in: Silicon Carbide and Related Materials 2000 (p389)
• Optical Emission Microscopy of Structural Defects in 4H-SiC PiN Diodes
  Published in: Silicon Carbide and Related Materials 2001 (p431)
• Photoelectrochemical Measurements on Cathodically Electrodeposited Films of Cadmium and Zinc Chalcogenide Compounds
  Published in: Cross-Disciplinary Applied Research in Materials Science and Technology (p1)