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Articles by keyword: «Core Electrons»

• 1D-ACAR Studies of As-Grown Impurity Centers in Silicon
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p795)
• Apparatus for the Measurement of the Annihilation-Gamma Spectra from the Annihilation of Positrons with Electrons in Selected Core Levels
  Published in: Positron Annihilation - ICPA-13 (p483)
• Atomic Environment of Positrons Annihilating in Different Parts of Cz-Si Single Crystal
  Published in: Gettering and Defect Engineering in Semiconductor Technology X (p507)
• Atomic Environment of Positrons Annihilating in HT Cz-Si Crystal
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p615)
• Configuration of DV Complexes In Ge: Positron Probing of Ion Cores
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p89)
• Investigation of the Composition of Precipitates in Al-Ag by Doppler Spectroscopy of Core Electrons
  Published in: Positron Annihilation - ICPA-13 (p51)
• Positron Annihilation Rate and Broad Component of 1D-ACAR in Cz-Si and Fz-Si
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p489)
• Positron Annihilation with Rare-Gas Core Electrons: Momentum Dependence of Enhancement Factor
  Published in: Positron Annihilation - ICPA-9 (p627)
• Positron Trapping by Oxygen-Related Defects in Silicon and Anisotropy of 1D-ACAR Spectra
  Published in: Gettering and Defect Engineering in Semiconductor Technology VIII (p333)
• Results of Systematic Study of Annihilation Photons 1D-Angular Distributions in Diamond-Like Semiconductors
  Published in: Positron Annihilation - ICPA-9 (p583)
• Study of Point Defects in Silicon by Means of Positron Annihilation with Core Electrons
  Published in: Positron Annihilation - ICPA-11 (p605)