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Articles by keyword: «FZ Silicon»

• Divacancy Induced Improvement for Stabilization of Silicon Conductivity versus Temperature
  Published in: Gettering and Defect Engineering in Semiconductor Technology XII (p21)
• Impact of Phosphorus Diffusion on the Contamination Level of Dislocations in Deformed Float Zone Silicon as Studied by Beam Injection Techniques
  Published in: Beam Injection Assessment of Defects in Semiconductors (p105)
• Microdefects in Nitrogen Doped FZ Silicon Revealed by Li⁺ Drifting
  Published in: Defects in Semiconductors 18 (p1761)
• Microscopic Studies of Radiation Damage-Induced Defects Responsible for the Deterioration of High-Resistivity Silicon Detectors
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p233)
• The Effect of Oxygen on the Brittle-to-Ductile Transition in Silicon Single Crystals
  Published in: PRICM7 (p1299)