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Articles by keyword: «LBIC»

• Analysis of Extended Defects in 6H-SiC Using Photoluminescence and Light Beam Induced Current Spectroscopy
  Published in: Silicon Carbide and Related Materials - 2002 (p317)
• Determination of the Surface Recombination Velocity and of Its Evolution in Monocrystalline Silicon by the Light Beam Induced Current Technique in Planar Configuration
  Published in: Beam Injection Assessment of Defects in Semiconductors (p123)
• Impact of Phosphorus Diffusion on the Contamination Level of Dislocations in Deformed Float Zone Silicon as Studied by Beam Injection Techniques
  Published in: Beam Injection Assessment of Defects in Semiconductors (p105)
• Improved P-Type or Raw N-Type Multicrystalline Silicon Wafers for Solar Cells
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p525)
• Laser Characterization of Semiconductors
  Published in: Semiconductor Processing and Characterization with Lasers (p141)
• LBIC Control Mapping of Textured Silicon Thin Film Obtained by Liquid Phase Epitaxy on Transferable Silicon Grid
  Published in: Beam Injection Assessment of Microstructures in Semiconductors (p49)
• LBIC Investigations of the Lifetime Degradation by Extended Defects in Multicrystalline Solar Silicon
  Published in: Beam Injection Assessment of Defects in Semiconductors (p115)
• Measurement of the Normalized Recombination Strength of Dislocations in Multicrystalline Silicon Solar Cells
  Published in: Gettering anf Defect Engineering in Semiconductor Technology IX (p701)
• Silicon Layers Grown on Siliconized Carbon Net: Producing and Properties
  Published in: Gettering and Defect Engineering in Semiconductor Technology XI (p503)
• Spatially Resolved Defect Analysis in Cz-Silicon after Copper-Nickel Co-Precipitation by Virtue of Light-Beam-Induced Current Measurements
  Published in: Gettering and Defect Engineering in Semiconductor Technology XIII (p431)