| Paper Title | Page |
|---|---|
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A New Approach to Study the Damage Induced by Inert Gases Implantation in Silicon Authors: S. Peripolli, Marie France Beaufort, David Babonneau, Sophie Rousselet, P.F.P. Fichtner, L. Amaral, Erwan Oliviero, Jean François Barbot, S.E. Donnelly |
357 |
|
Authors: N. Gay, Santo Martinuzzi |
115 |
|
Depth-Selective 2D-ACAR with POSH: Application to Nanocavities Generated by Ion Implantation Authors: C.V. Falub, S.W.H. Eijt, A. van Veen, P.E. Mijnarends, H. Schut |
561 |
|
Electrical Characterisation of 4H-SiC Epitaxial Samples Treated by Hydrogen or Helium Authors: Laurent Ottaviani, Damien Barakel, Eugene B. Yakimov, Marcel Pasquinelli |
347 |
|
Gold Gettering by H+ or He++ Ion Implantation Induced Cavities and Defects in Cz Silicon Wafers Authors: Isabelle Périchaud, Eugene B. Yakimov, Santo Martinuzzi, Christiane Dubois |
297 |
|
Grain Boundary Structure and Composition Following Superplastic Deformation of Al-Mg Alloys Authors: J.S. Vetrano, E.P. Simonen, S.M. Bruemmer |
493 |
|
Nickel Gettering in Silicon: Role of Oxygen Authors: G. Regula, R. El Bouayadi, Bernard Pichaud, E. Ntsoenzok |
355 |
|
Positronium Behaviour in Elongated PPT, Rectangular MgO and Spherical Si Nanocavities Authors: S.W.H. Eijt, C.V. Falub, P.E. Mijnarends, A. van Veen |
588 |
|
Spin-Lattice Relaxation of Dipolar Energy in Fluid Confined to Nanosize Cavities Authors: Gregory Furman, Shaul Goren |
47 |