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Articles by keyword: «Oxide Breakdown»

• Electrical Characterization of MOS Structures with Deposited Oxides Annealed in N₂O or NO
  Published in: Silicon Carbide and Related Materials 2008 (p521)
• Evaluation of 4H-SiC Carbon Face Gate Oxide Reliability
  Published in: Silicon Carbide and Related Materials 2010 (p354)
• Hydrogen Annealed Silicon Wafer
  Published in: Gettering and Defect Engineering in Semiconductor Technology VII (p19)
• Influence of the Oxidation Temperature and Atmosphere on the Reliability of Thick Gate Oxides on the 4H-SiC C(000-1) Face
  Published in: Silicon Carbide and Related Materials 2007 (p597)