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Articles by keyword: «Reciprocal Space Mapping (RSM)»

• Characterization of SiC Epitaxial Structures using High-Resolution X-Ray Diffraction Techniques
  Published in: Silicon Carbide and Related Materials 2003 (p157)
• Effect of Nitridation on Indium-Composition of InGaN Films
  Published in: Materials Integration (p193)
• In-Plane Rotated Crystal Structure in Continuous Growth of Bismuth Cuprate Superconducting Film
  Published in: Theory, Modeling and Numerical Simulation (p53)
• Investigation of SiGe/Si - Heterostructures with High Resolution X-Ray Diffraction Methods
  Published in: European Powder Diffraction 6 (p457)
• Mapping in Real and Reciprocal Space
  Published in: European Powder Diffraction 5 (p216)
• MBE Growth of Device-Quality Cubic GaN on Atomically Flat (001) GaAs Prepared by Atomic-Hydrogen Treatment at High Temperatures
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p1221)
• Software Package for Data Acquisition and Remote Control of the High-Temperature X-Ray Diffractometer, Hotbird
  Published in: European Powder Diffraction EPDIC 7 (p212)
• X-Ray Diffraction Reciprocal Space Mapping Study of Modulated Crystal Structures in 10M Ni-Mn-Ga Martensitic Phase
  Published in: Ferromagnetic Shape Memory Alloys II (p63)
• X-Ray Triple Crystal Diffractometry of Structural Defects in Si_mGe_n Superlattices
  Published in: Defects in Semiconductors 17 (p1325)