Papers by Keyword: Reciprocal Space Mapping (RSM)

Abstract: The Present Study Aims to Understand the Relation between the Nitridation and Indium-Composition of Ingan Grown on Sapphire Substrate Using the Metalorganic Vapor Phase Epitaxy through X-Ray Diffraction Reciprocal Space Mapping Measurements. In-Composition of InGaN on Nitrided Sapphire Substrate Increased to 13% which Is Higher than the Sample without Nitridation with 7%. Also, Flat Surface Was Observed in the Nitrided Sample. Two Times Larger in-Plane Strain Was Induced at the Nitired Sample. Ingan Grown on Low-Temperature Gan Buffer, however, Did Not Show Clear Effect of Nitridation. The Two Investigated Samples Showed Similar Indium Composition, Surface Flatness, and in-Plane Strain with and without Nitridation. Differences of Indium Incorporation and Relaxation of in-Plane Strain Were Attributed to the Effect of AIN Formed by Nitridation Process.

Abstract: The 10M modulated crystal structure in Ni-Mn-Ga martensitic phase with about 0.5 MPa twinning stress, was studied by X-ray diffraction reciprocal space mapping (RSM). The experimental procedure is established for collecting large range of RSM with scattering planes inclined to the surface of specimen. The investigation focused on the superlattice reflections caused by the modulation, which always appeared in two <110> directions in bulk material. The distribution of two modulation domains varies with scattering locations.

Abstract: Bismuth cuprate superconductor has a unique structure called a structural modulation (supercell, SC) consisting of modulated several unit cells. Strain induced by multilayered structure increases the intensity of SC modulation, while an oxygen deficient sample shows expansion of SC size. In this study, as opposed to the multilayer strain, by preparing samples with thick film thicknesses the effect of strain on crystal structure was investigated including SC structure. Epitaxial growth was verified by x-ray diffraction, and the thicker film showed other epitaxial phase rotated 32° around the surface normal with respect to the initial epitaxial phase. The SC size estimated by x-ray reciprocal space mapping was double the size of the initial epitaxial phase. Interestingly, the initial epitaxial phase became a dominant structure after further deposition. In order to evaluate the different SC size and SC modulation, a new index related with an incline of the modulation vector was proposed.