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Articles by keyword: «Secondary Ion Mass Spectroscopy (SIMS)»

• A Contribution to the Characterization of Multicrystalline Solar Silicon
  Published in: Polycrystalline Semiconductors III (p421)
• Accurate CsM⁺ SIMS Aluminum Dopant Profiling in SiC
  Published in: Silicon Carbide and Related Materials 2005 (p629)
• Angle Dependent Sputtering and Dimer Formation from Vanadium Nitride Target by Ar⁺ Ion Bombardment
  Published in: AICAM 2005 (p607)
• Atomic Diffusion of Al and Si in Cu_44.25Ag_14.75Zr₃₆Ti₅ Bulk Metallic Glass
  Published in: Machinery, Materials Science and Engineering Applications (p804)
• Behavior of Hydrogen Atoms in Perovskite-Type Oxide Thin Films under Electric Fields
  Published in: Asian Ceramic Science for Electronics III and Electroceramics in Japan XII (p281)
• Copper Diffusion in Nickel Thin Film under Stresses in the Kinetic Regime 'B'
  Published in: Grain Boundary Diffusion and Grain Boundary Segregation (p181)
• Defect Structure in (Zn,Mg)O Films Prepared on YSZ Substrate
  Published in: Electroceramics in Japan IX (p103)
• Diffusion in L1₀-Type Single Crystal TiAl and FePt Intermetallic Compounds
  Published in: Diffusion in Materials - DIMAT2004 (p7)
• Dilute Aluminium Concentration in 4H-SiC: from SIMS to LTPL Measurements
  Published in: Silicon Carbide and Related Materials 2003 (p775)
• EBSP and SIMS Studies of Oxygen Tracer Diffusion in the High Temperature Superconductor La_2-xSr_xCuO₄
  Published in: Textures of Materials - ICOTOM 10 (p1161)
• Effect of Al-Doping into Zinc Oxide Films Prepared by Pulsed Laser Deposition Method with Various Oxidation Assists
  Published in: Electroceramics in Japan VIII (p75)
• Effect of Annealing Atmosphere on Oxygen Diffusion through Ba-Fe-Based Perovskite Oxide
  Published in: Electroceramics in Japan XIV (p141)
• Electrochemical Active Parts at Electrode/Electrolyte Interfaces for Solid Oxide Fuel Cells (SOFCs) by Isotope Labeling-SIMS Analysis
  Published in: 11th International Ceramics Congress (p1857)
• Electromechanical Coupling Coefficient of SAW on Proton-Exchanged and Annealed LiNbO₃ Waveguides
  Published in: Advanced Materials and Processes (p1957)
• Erbium Doping to P-Based III-V Semiconductors by OMVPE with TBP as a Non-Toxic P Source
  Published in: Defects in Semiconductors 18 (p621)