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Articles by keyword: «Surface States»

• Application and Improvement of the Spreading Resistance Method for p-Type 6H-SiC
  Published in: Silicon Carbide and Related Materials - 1999 (p741)
• Contactless Characterization of Semiconductors Using Laser-Induced Surface Photo-Charge Voltage Measurements
  Published in: Semiconductor Processing and Characterization with Lasers (p221)
• Effects of Rapid Thermal Annealing Treatment on the Surface Band Bending of n-type GaN Studied by Surface Potential Electric Force Microscopy
  Published in: Silicon Carbide and Related Materials 2005 (p1529)
• Effects of the Cooling-Off Condition on the Oxidation Process in 6H-SiC
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p845)
• Electronic and Atomic Structure of an Ordered Silicate Adlayer on Hexagonal SiC
  Published in: Silicon Carbide and Related Materials - 1999 (p387)
• Electronic and Atomic Structure of the C-Terminated 6H-SiC Surface
  Published in: Silicon Carbide, III-Nitrides and Related Materials (p331)
• High-Purity Versus High-Defect-Density Semiinsulating Substrates for SiC MESFET: Simulation of Device Characteristics
  Published in: Silicon Carbide and Related Materials 2004 (p869)
• Investigation of Additional States in the Silicon Carbide Surface after Diffusion Welding
  Published in: Silicon Carbide and Related Materials 2011 (p275)
• On-Chip Tensile Testing of the Mechanical and Electro-Mechanical Properties of Nano-Scale Silicon Free-Standing Beams
  Published in: Nanoscaled Semiconductor-on-Insulator Materials, Sensors and Devices (p117)
• Oxygen Deficiency and V and Sb Doping in TiO₂ and SnO₂: Influences on Surface Electronic Structure
  Published in: Interfaces of Ceramic Materials (p11)
• Passivation and Control of Semiconductor Interfaces by Interface Control Layers
  Published in: Passivation of Metals and Semiconductors (p23)
• Photoemission Study of the Silicate Adlayer Reconstruction on Si-terminated 6H-SiC (0001)
  Published in: Silicon Carbide and Related Materials - 1999 (p391)
• Plasma Passivation of III-V Semiconductor Surfaces
  Published in: Hydrogen in Compound Semiconductors (p159)
• Positron Annihilation at Clean Metallic Surfaces
  Published in: Positron Annihilation - ICPA-9 (p341)
• Positron Lifetimes on Clean Metallic Surfaces
  Published in: Positron Annihilation - ICPA-9 (p1455)