On the ESD EMP Effect and Strengthening Technology of SCMs
In order to study the interference and destructive effects of electromagnetic pulse for electronic systems, a test was done for an SCM system to check the irradiation effect of ESD EMP for it. According to the result of the test, under the effect of ESD EMP, the SCM would suffer multiple kinds of faults. This paper mainly introduces an exterior RAM effect test done for an SCM and the corresponding measures taken on the basis.
Dongye Sun, Wen-Pei Sung and Ran Chen
S. L. Yang et al., "On the ESD EMP Effect and Strengthening Technology of SCMs", Applied Mechanics and Materials, Vols. 121-126, pp. 2136-2140, 2012