On the ESD EMP Effect and Strengthening Technology of SCMs

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Abstract:

In order to study the interference and destructive effects of electromagnetic pulse for electronic systems, a test was done for an SCM system to check the irradiation effect of ESD EMP for it. According to the result of the test, under the effect of ESD EMP, the SCM would suffer multiple kinds of faults. This paper mainly introduces an exterior RAM effect test done for an SCM and the corresponding measures taken on the basis.

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2136-2140

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October 2011

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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