On the ESD EMP Effect and Strengthening Technology of SCMs

Abstract:

Article Preview

In order to study the interference and destructive effects of electromagnetic pulse for electronic systems, a test was done for an SCM system to check the irradiation effect of ESD EMP for it. According to the result of the test, under the effect of ESD EMP, the SCM would suffer multiple kinds of faults. This paper mainly introduces an exterior RAM effect test done for an SCM and the corresponding measures taken on the basis.

Info:

Periodical:

Edited by:

Dongye Sun, Wen-Pei Sung and Ran Chen

Pages:

2136-2140

DOI:

10.4028/www.scientific.net/AMM.121-126.2136

Citation:

S. L. Yang et al., "On the ESD EMP Effect and Strengthening Technology of SCMs", Applied Mechanics and Materials, Vols. 121-126, pp. 2136-2140, 2012

Online since:

October 2011

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Price:

$35.00

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