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Paper Titles
An Emulation Method of Sensor Clutter Plots Elimination Using Statistical Characteristics Analysis
p.3345
The Numerical Simulation of the Flow Field of Explosion in Hermitic Cavity and the Response of the Shell Structure
p.3349
Research on Back Analysis of Parameters for Excavation of the Underground Cavern Group of a Large-Scale Hydro-Power Station by Using Orthogonal Optimization
p.3356
Micro-Deformation Mechanism of Granular Materials under Different Boundary Conditions Based on DEM Simulation
p.3361
Computer Simulation of the Metal Silicide
p.3367
Numerical Simulation of Wind Pressure on Different Types of Large-Span Roofs
p.3371
A Comparison of Cohesive Crack Model and Crack Band Model in Concrete Fracture
p.3375
Parameter Identification of a Class of Non-Autonomous Chaotic Systems
p.3381
The Simulation of Cutter-Rock Interaction in PFC
p.3385

Computer Simulation of the Metal Silicide

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Abstract:

We have investigated the optical properties of the Fm-3m-Mg2Si using the first-principles plane-wave pseudo-potential method. Some important optical parameters (reflectivity, refractive index, extinction coefficient, loss function and dielectric function) are calculated and investigated at high pressure. The calculated static dielectric constant ε(0) is 15.9. The computed plasma frequency is 12eV. Some interesting features in the optical parameters are found in the low frequency region. Nevertheless, the calculated result needs to be testified by experiments in the near future.

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Periodical:

Applied Mechanics and Materials (Volumes 170-173)

Pages:

3367-3370

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.170-173.3367

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Online since:

May 2012

Authors:

Dong Chen, Chao Xu

Keywords:

Information Technology (IT), Optical Property, Semiconductor

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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References

[1] G. S. Nolas, D. Wang and M. Beekman: Phys. Rev. B Vol. 76 (2007), p.235204

Google Scholar

[2] J. I. Tani and H. Kido: Physica B Vol. 364 (2005), p.218

Google Scholar

[3] S. T. Kelly, S. L. Van Atta, J. J. Vajo, G. L. Olson and B. M. Clemens: Nanotechnology Vol. 20 (2009), p.204017

DOI: 10.1088/0957-4484/20/20/204017

Google Scholar

[4] A. Grzechnik, A. Vegas, K. Syassen, I. Loa, M. Hanfland and M. Jansen: J. Solid State Chem. Vol. 154 (2000), p.603

DOI: 10.1006/jssc.2000.8902

Google Scholar

[5] L. H. Brixner: Mater. Res. Bull. Vol. 11 (1976), p.1453

Google Scholar

[6] S. J. Duclos, Y. K. Vohra, A. L. Ruoff, A. Jayaraman and G. P. Espinosa: Phys. Rev. B Vol. 38 (1988), p.7755

Google Scholar

[7] C. J. Buchenauer and M. Cardona: Phys. Rev. B Vol. 3 (1971), p.2504

Google Scholar

[8] B. Arnaud and M. Alouani: Phys. Rev. B Vol. 64 (2001), p.033202

Google Scholar

[9] Y. Imai, A. Watanabe and M. Mukaida: J. Alloys Compd. Vol. 358 (2003), p.257

Google Scholar

[10] J. Zhang, Y. Q. Wang, B. Yang and B. L. Zhou: J. Mater. Res. Vol. 14 (1999), p.68

Google Scholar

[11] B. Yu, D. Chen, Q. Tang, C. Wang and D. Shi: J. Phys. Chem. Solids Vol. 71 (2010), p.758

Google Scholar

[12] J. P. Perdew, K. Burke and M. Ernzerhof: Phys. Rev. Lett. Vol. 77 (1996), p.3865

Google Scholar

[13] H. J. Monkhorst and J. D. Pack: Phys. Rev. B Vol.13 (1976), p.5188

Google Scholar

[14] R. Saniz, L. H. Ye, T. Shishidou and A. J. Freeman: Phys. Rev. B Vol. 74 (2006), p.014209

Google Scholar

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