Design of Multi-Signal Testing System Based on ARM & FPGA

Jian Jun Dong; Tan Sheng Zhou

doi:10.4028/www.scientific.net/AMM.182-183.1215

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 182-183Design of Multi-Signal Testing System Based on ARM...

Design of Multi-Signal Testing System Based on ARM & FPGA

Abstract:

This paper presents a multi-signal testing system based on ARM & FPGA, Paper discussed system structure design, including hardware and software design. The hardware uses FPGA to expand ports and USB2.0 interface chip CY7C68013 for signals data transmission; software including system firmware, driver, user applications the three-parts design. The design of the system meet requirements, its high performance, low cost and can be widely used in signal analysis, monitoring and other fields.

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Periodical:

Applied Mechanics and Materials (Volumes 182-183)

Pages:

1215-1219

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.182-183.1215

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Online since:

June 2012

Authors:

Jian Jun Dong, Tan Sheng Zhou

Keywords:

A/D (Analog/Digital Converter), ARM (ARM-Processor), Field-Programmable Gate Array (FPGA), Port, VHDL (Very High Density Lioprotein)

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References

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