Measurement of Dislocation Density in Cold-Drawn Steel Wires by Means of X-Ray Bragg Profiles Analysis

Abstract:

Cold-drawn pearlitic steel wires are widely used in numerous engineering fields. One of the most powerful analysis methods on determining the dislocation character of this heavily cold worked material is to investigate the X–ray diffraction line-profile broadening. Fourier line–broadening analysis in steel wires with near eutectoid composition indicates that with cumulative true strains, the initial dislocation density of 6×10¹⁴m^-2 in the rods increases at least one magnitude in wires. Up to 1.5×10¹⁶m^-2 of dislocation density is found in the ferrite lamella of wires with a true strain of 2.77.

• Periodical: Applied Mechanics and Materials (Volumes 184-185)
• Pages: 1054-1059
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.184-185.1054
• Online since: June 2012
• Authors: Fan Yang, Ying Ying Fan, Yi Ming Jin
• Keywords: Cold-Drawn Wire, Dislocation Density, Fourier Line-Broadening Analysis, X-Ray Diffraction (XRD)

References

[1] J. Toribio, M. Toledano: Construction and Building Materials, Vol. 14 (2000), p.47.

[2] L. Kasper, W. Martine and V. Bert: Proc. Eng. Vol. 10 (2011), p.3259.

[3] X.D. Zhang, G. Andy and X.X. Huang: Acta Mater. Vol. 59 (2011), p.3422.

[4] Y. Wang, S. Lee and Y. Lee. J. Appl. Cryst., 15 (1982), p.35.

[5] T. Ungár, I. Dragomir and Á. Révész: J. Appl. Crystallogr. Vol. 32 (1999), p.992.

[6] N. Zhang, Y. Wang: Thin Solid Films, Vol. 214 (1992), p.4.

[7] FL, Shan, Y. Wang: Vacuum Vol. 51(1998), p.381.

[8] A. R. Strokes: Proc. Phys. Soc. Vol. A61 (1948), p.382.

[9] B.E. Warren, Progress in Metal Physics, Vol. 8. Pergamon Press, London, 1959, p.147.

[10] Y. Wang, Z. Zhang. Phys., 35 (1987), p.109.

[11] Lsaf manual, Materials Research Center, Jilin University, (1993).

[12] M. Wilkens: Phys. Status Solidi(a) Vol. 2 (1970), p.359.

[13] T. Ungár, G. Tichy Phys. Phys. Stat. Sol. (a), 171 (1999), p.425.

[14] P. Haasen Phy. Metall. Cambridge University Press, Cambridge (1996).

[15] T. Ungár, M. Leoni and P. Scardi: J. Appl. Crystallogr. Vol. 32, (1999), p.290.

[16] F. Yang, C. Ma and J.Q. Jiang: Scripta Materi., Vol (59) (2008), p.850.