Multiaperture Connection Method for Three-Dimensional Mesasurement Based on Quaternion

Article Preview

Abstract:

A novel multiaperture connection method for three-dimensional shape measurement is presented. The principle of multiaperture method is to obtain subapertures relative location and orientation by measuring the object from different subapertures, and afterwards connecting them together. Rrotation and transformation of subapertures are the key problems to realize multiaperture connection. In order to improve calculability and efficiency of the connection algorithm, a new connection method using quaternion is proposed. The mathematic model of multiaperture connection associated with our proposed method is discussed, and the experimental measurement on the basis of digital grating projection system is carried out to demonstrate the validity of this suggested method. Compared with the conventional connection method, this method offers with such advantages as computational simplicity, high efficiency and reasonable accuracy.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

2736-2739

Citation:

Online since:

November 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Takeda, M. and Mutoh, K., "Fourier transform profilometry for the automatic measurement of 3-D object shapes," Appl. Opt. 22(24), 3977-3982 (1983).

DOI: 10.1364/ao.22.003977

Google Scholar

[2] Chen, F., Brown, G. M. and Song, M., "Overview of three-dimensional shape measurement using optical methods," Opt. Eng. 39(1), 10-22 (2000).

DOI: 10.1117/1.602438

Google Scholar

[3] Robert Sitnik and Malgorzata kujawinska, "Digital fringe projection system for large-volume 360-deg shape measurement," Opt. Eng.41(2), 443-449 (2002).

DOI: 10.1117/1.1430422

Google Scholar

[4] Mingyi Chen and Weiming Cheng, "Multi-aperture overlap-scanning technique for large aperture test," Proc. SPIE 1553, 626-635 (1991).

Google Scholar

[5] Murphy, P., Forbes, G., Fleig, J., Dumas, P. and Tricad, M., "Stitching interferometry: A flexible solution for surface metrology," Opt. Photn. News 14, 38-43 (2003).

DOI: 10.1364/opn.14.5.000038

Google Scholar